University of Hertfordshire

By the same authors

A Classification of Threats to Remote Online Examinations

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Original languageEnglish
Title of host publication2016 IEEE 7th Annual Information Technology, Electronics and Mobile Communication Conference
PublisherIEEE
Number of pages6
ISBN (Electronic)978-1-5090-0996-1
ISBN (Print)978-1-5090-0997-8
DOIs
Publication statusPublished - 17 Nov 2016
Event2016 IEEE 7th Annual Information Technology, Electronics and Mobile Communications Conference - University of British Columbia, Vancouver, Canada
Duration: 13 Oct 201615 Oct 2016
Conference number: 38388
http://www.ieee.org/conferences_events/conferences/conferencedetails/index.html?Conf_ID=38388

Conference

Conference2016 IEEE 7th Annual Information Technology, Electronics and Mobile Communications Conference
Abbreviated title2016 IEEE 7th Annual IEMCON Conference
CountryCanada
CityVancouver
Period13/10/1615/10/16
Internet address

Abstract

Summative online examinations is a high stake
process which faces many security threats. The lack of face-toface
interaction, monitoring or invigilation motivates many
threats, which includes intrusion by hackers and collusion by
students. This paper is based on a survey of literature to present
a threat classification using security abuse case scenarios.
Collusion is one of the challenging threats, when a student invites
a third party collaborator to impersonate or aid a student to take
an online test. While mitigation of all types of threats is
important, the risk of collusion is increasingly challenging
because it is difficult to detect such attacks.

Notes

This document is the Accepted Manuscript version of the following paper: Abrar Ullah, Hannah Xiao, and Trevor Barker, ‘A Classification of Threats to Remote Online Examinations’, in Proceedings of the 2016 IEEE 7th Annual Information Technology, Electronics and Mobile Communication Conference (IEMCON), 13-15 October 2016, Vancouver, Canada. Published by IEEE, available online via http://ieeexplore.ieee.org/document/7746085/ Copyright © 2016, IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.

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