University of Hertfordshire

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Refractive index profile measurements of diffused optical waveguides

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Original languageEnglish
Number of pages5
Pages (from-to)2112-2116
JournalApplied Optics
Journal publication date1 Sep 1974
Publication statusPublished - 1 Sep 1974


Refractive index profiles resulting from the fabrication of optical waveguides by diffusion techniques are measured using a reflection interferometric technique. In Cd-diffused ZnSe waveguides, the index variations are found to be complementary error functions that closely follow the composition changes for deep ( greater than 5 mu m) diffusions. Shallow ( less than 5 mu m) diffusions produce waveguides in which the index profile is a complementary error function that differs significantly from the composition profile. The relationship between composition and refractive index is determined for Cd compositions less than 10%. Refractive index profiles in commercially available diffused glass waveguides (SELFOC rod and fibers) are also described.

ID: 1996248