| Original language | English |
|---|---|
| Patent number | US5471299 |
| IPC | PCT/393,003,317 |
| Publication status | Published - 28 Nov 1995 |
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Apparatus and Method for the Analysis of Particle Characteristics using Monotonically Scattered light.
- Paul Kaye (Inventor)
- , Edwin Hirst (Inventor)
Research output: Patent
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