Automated Visual Defect Detection for Flat Steel Surface: A Survey

Qiwu  Luo; Xiaoxin Fang; Li Liu; Chunhua Yang; Yichuang Sun

Automated Visual Defect Detection for Flat Steel Surface: A Survey

Qiwu Luo
, Xiaoxin Fang
, Li Liu
, Chunhua Yang
, Yichuang Sun

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	IEEE International Instrumentation & Measurement Technology Conference (I2MTC)
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Publication status	Published - 18 May 2021
Event	IEEE I2MTC 2021 - The International Instrumentation and Measurement Technology Conference - Ottawa, Canada Duration: 17 May 2021 → 20 May 2021 https://i2mtc2021.ieee-ims.org/

Conference

Conference	IEEE I2MTC 2021 - The International Instrumentation and Measurement Technology Conference
Country/Territory	Canada
City	Ottawa
Period	17/05/21 → 20/05/21
Internet address	https://i2mtc2021.ieee-ims.org/

Cite this

@inproceedings{e0960716abdf413f9f24e5aef9f0a1a9,

title = "Automated Visual Defect Detection for Flat Steel Surface: A Survey",

author = "Qiwu Luo and Xiaoxin Fang and Li Liu and Chunhua Yang and Yichuang Sun",

year = "2021",

month = may,

day = "18",

language = "English",

booktitle = "IEEE International Instrumentation \& Measurement Technology Conference (I2MTC)",

publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

address = "United States",

note = "IEEE I2MTC 2021 - The International Instrumentation and Measurement Technology Conference ; Conference date: 17-05-2021 Through 20-05-2021",

url = "https://i2mtc2021.ieee-ims.org/",

}

Luo, Q, Fang, X, Liu, L, Yang, C & Sun, Y 2021, Automated Visual Defect Detection for Flat Steel Surface: A Survey. in IEEE International Instrumentation & Measurement Technology Conference (I2MTC). Institute of Electrical and Electronics Engineers (IEEE), IEEE I2MTC 2021 - The International Instrumentation and Measurement Technology Conference, Ottawa, Canada, 17/05/21.

TY - GEN

T1 - Automated Visual Defect Detection for Flat Steel Surface: A Survey

AU - Luo, Qiwu

AU - Fang, Xiaoxin

AU - Liu, Li

AU - Yang, Chunhua

AU - Sun, Yichuang

PY - 2021/5/18

Y1 - 2021/5/18

M3 - Conference contribution

BT - IEEE International Instrumentation & Measurement Technology Conference (I2MTC)

PB - Institute of Electrical and Electronics Engineers (IEEE)

T2 - IEEE I2MTC 2021 - The International Instrumentation and Measurement Technology Conference

Y2 - 17 May 2021 through 20 May 2021

ER -