Abstract
Nanowires and nanotubes composed of layered or nonlayered materials have been fabricated via different techniques, among which Anodic Aluminium Oxide (AAO) template-based electrodeposition technology provides a versatile technique for synthesizing one or two-dimensional nanostructured materials. Herein, Conductive Atomic Force Microscopy (CAFM) has been used to image and characterise the nanorods for nanorods with diameter of 50 nm ±5. Given that only one previous study using CAFM on gold nanorods exists [1], recording the difficulties encountered with this technique will be of wider interest to the scientific community. This work details experiments on electrical response as a function of applied force on the AFM tip and contamination on the top surface on nanorods. We report a novel observation, revealing a hollow shaped conductive pattern of some of our gold nanorods. This is explained with reference to competing growth rates in horizontal and vertical directions inside the pores.
| Original language | English |
|---|---|
| Number of pages | 23 |
| Journal | Applied Surface Science |
| Publication status | Submitted - 11 Nov 2019 |
Keywords
- Nanotube Growth Mechanism, Electrical and Mechanical Characterisation, Conductive pattern, Conductive Atomic Force Microscopy (CAFM), Gold Nanorod
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