Abstract
Micro patterns can be a useful proxy for the quality of software. Classes matching certain categories of micro patterns were shown to be more fault prone than others, and those classes that do not correspond to any category of micro patterns were shown to be more likely to be faulty. In this paper we present a preliminary study of traditional software metrics and micro patterns in three versions of Eclipse (2.1, 3.0, 3.1) in order to understand if it is possible to relate the stability of a software system with micro patterns.
Original language | English |
---|---|
Title of host publication | 2015 IEEE 2nd International Workshop on Patterns Promotion and Anti-Patterns Prevention, PPAP 2015 - Proceedings |
Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
Pages | 11-12 |
Number of pages | 2 |
ISBN (Electronic) | 9781467369206 |
DOIs | |
Publication status | Published - 1 Apr 2015 |
Event | 2nd IEEE International Workshop on Patterns Promotion and Anti-Patterns Prevention, PPAP 2015 - Montreal, Canada Duration: 2 Mar 2015 → … |
Conference
Conference | 2nd IEEE International Workshop on Patterns Promotion and Anti-Patterns Prevention, PPAP 2015 |
---|---|
Country/Territory | Canada |
City | Montreal |
Period | 2/03/15 → … |