Current-modulating magnetic force microscope probe

Frank Wang; Na Helian; Warwick Clegg; James Windmill; Robert Windmill; David Jenkins

doi:https://doi.org/10.1063/1.1358817

Current-modulating magnetic force microscope probe

Frank Wang, Na Helian, Warwick Clegg, James Windmill, Robert Windmill, David Jenkins

Research output: Contribution to journal › Article › peer-review

Abstract

A new current-modulating probe for the magnetic force microscope (MFM) is proposed in this article. The magnetic field, which will be used to interact with a magnetic specimen’s stray field, is induced on the sharp tip of the conical magnetic core surrounded by a microfabricated single turn conductive coil. The reciprocity principle is used to obtain the force acting on the probe due to the specimen’s stray field when scanned over a magnetic specimen. The magnetic field intensity is adjustable by control of the applied current. Images of specimens have been modeled using this probe. The suitability to different specimens is seen to be the biggest advantage of this scheme over the conventional probe designs.

Original language	English
Pages (from-to)	6778-6780
Journal	Journal of Applied Physics
Volume	89
Issue number	11
DOIs	https://doi.org/10.1063/1.1358817
Publication status	Published - 1 Jun 2001

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title = "Current-modulating magnetic force microscope probe",

abstract = "A new current-modulating probe for the magnetic force microscope (MFM) is proposed in this article. The magnetic field, which will be used to interact with a magnetic specimen{\textquoteright}s stray field, is induced on the sharp tip of the conical magnetic core surrounded by a microfabricated single turn conductive coil. The reciprocity principle is used to obtain the force acting on the probe due to the specimen{\textquoteright}s stray field when scanned over a magnetic specimen. The magnetic field intensity is adjustable by control of the applied current. Images of specimens have been modeled using this probe. The suitability to different specimens is seen to be the biggest advantage of this scheme over the conventional probe designs.",

author = "Frank Wang and Na Helian and Warwick Clegg and James Windmill and Robert Windmill and David Jenkins",

year = "2001",

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AU - Wang, Frank

AU - Helian, Na

AU - Clegg, Warwick

AU - Windmill, James

AU - Windmill, Robert

AU - Jenkins, David

PY - 2001/6/1

Y1 - 2001/6/1

N2 - A new current-modulating probe for the magnetic force microscope (MFM) is proposed in this article. The magnetic field, which will be used to interact with a magnetic specimen’s stray field, is induced on the sharp tip of the conical magnetic core surrounded by a microfabricated single turn conductive coil. The reciprocity principle is used to obtain the force acting on the probe due to the specimen’s stray field when scanned over a magnetic specimen. The magnetic field intensity is adjustable by control of the applied current. Images of specimens have been modeled using this probe. The suitability to different specimens is seen to be the biggest advantage of this scheme over the conventional probe designs.

AB - A new current-modulating probe for the magnetic force microscope (MFM) is proposed in this article. The magnetic field, which will be used to interact with a magnetic specimen’s stray field, is induced on the sharp tip of the conical magnetic core surrounded by a microfabricated single turn conductive coil. The reciprocity principle is used to obtain the force acting on the probe due to the specimen’s stray field when scanned over a magnetic specimen. The magnetic field intensity is adjustable by control of the applied current. Images of specimens have been modeled using this probe. The suitability to different specimens is seen to be the biggest advantage of this scheme over the conventional probe designs.

UR - https://pubs.aip.org/aip/jap/article/89/11/6778/485096/Current-modulating-magnetic-force-microscope-probe

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VL - 89

SP - 6778

EP - 6780

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 11

ER -

Current-modulating magnetic force microscope probe

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