Design of test stimuli and minimization of ambiguity in fault diagnosis of analogue circuits with tolerance

Y. Tan, Y. He, Yichuang Sun

    Research output: Contribution to journalArticlepeer-review

    2 Citations (Scopus)

    Abstract

    A novel method of stimuli design for analogue circuit fault diagnosis is presented based on a genetic algorithm and wavelet packet decomposition. The method is characterised by reduced fault ambiguity and more accurate fault classification. Computation is also reduced because the method does not require matrix inversion and calculation. The proposed method is suitable for transient and AC input sources and can be applied to both linear and nonlinear circuits.
    Original languageEnglish
    Pages (from-to)173-183
    JournalInternational Journal of Electronics
    Volume98
    Issue number2
    DOIs
    Publication statusPublished - 2010

    Keywords

    • fault diagnosis
    • tolerance
    • analogue circuits
    • stimuli design
    • wavelets
    • GA

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