Design of test stimuli and minimization of ambiguity in fault diagnosis of analogue circuits with tolerance

Keyphrases

• Test Suite Minimization 100%
• Test Design 100%
• Test Stimuli 100%
• Analog Circuit Fault Diagnosis 100%
• Linear Circuits 50%
• Input Source 50%
• Nonlinear Circuits 50%
• Fault Classification 50%
• Stimulus Design 50%
• Matrix Calculation 50%
• Wavelet Packet Decomposition 50%
• Matrix Inversion 50%
• Genetic Algorithm 50%

Engineering

• Test Stimulus 100%
• Fits and Tolerances 100%
• Fault Diagnosis 100%
• Analog Circuit 100%
• Input Source 50%
• Circuit Faults 50%
• Genetic Algorithm 50%
• Linear Circuit 50%
• Nonlinear Circuit 50%
• Transients 50%