Development of a framework for automated systematic testing of safety-critical embedded systems

S. Kandl, Raimund Kirner, P. Puschner

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)
40 Downloads (Pure)

Abstract

In this paper we introduce the development of a framework for testing safety-critical embedded systems based on the concepts of model-based testing. In model-based testing the test cases are derived from a model of the system under test. In our approach the model is an automaton model that is automatically extracted from the C-source code of the system under test. Beside random test data generation the test case generation uses formal methods, in detail model checking techniques. To find appropriate test cases we use the requirements defined in the system specification. To cover further execution paths we developed an additional, to our best knowledge, novel method based on special structural coverage criteria. We present preliminary results on the model extraction using a concrete industrial case study from the automotive domain.
Original languageEnglish
Title of host publicationProceedings of the Fourth International Workshop on Intelligent Solutions in Embedded Sysems
EditorsW Elmenreich, G Novak, RED Seepold
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages65-77
Number of pages13
ISBN (Print)3-902463-06-6
DOIs
Publication statusPublished - 2006
Event4th International Workshop on Intelligent Solutions in Embedded Systems (WISES 2006) - Vienna
Duration: 30 Jun 2006 → …

Conference

Conference4th International Workshop on Intelligent Solutions in Embedded Systems (WISES 2006)
CityVienna
Period30/06/06 → …

Keywords

  • TEST-CASE GENERATION
  • MODEL CHECKING

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