Development of a framework for automated systematic testing of safety-critical embedded systems

S. Kandl; Raimund Kirner; P. Puschner

doi:10.1109/WISES.2006.329116

Development of a framework for automated systematic testing of safety-critical embedded systems

S. Kandl, Raimund Kirner, P. Puschner

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

6 Citations (Scopus)

42 Downloads (Pure)

Abstract

In this paper we introduce the development of a framework for testing safety-critical embedded systems based on the concepts of model-based testing. In model-based testing the test cases are derived from a model of the system under test. In our approach the model is an automaton model that is automatically extracted from the C-source code of the system under test. Beside random test data generation the test case generation uses formal methods, in detail model checking techniques. To find appropriate test cases we use the requirements defined in the system specification. To cover further execution paths we developed an additional, to our best knowledge, novel method based on special structural coverage criteria. We present preliminary results on the model extraction using a concrete industrial case study from the automotive domain.

Original language	English
Title of host publication	Proceedings of the Fourth International Workshop on Intelligent Solutions in Embedded Sysems
Editors	W Elmenreich, G Novak, RED Seepold
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Pages	65-77
Number of pages	13
ISBN (Print)	3-902463-06-6
DOIs	https://doi.org/10.1109/WISES.2006.329116
Publication status	Published - 2006
Event	4th International Workshop on Intelligent Solutions in Embedded Systems (WISES 2006) - Vienna Duration: 30 Jun 2006 → …

Conference

Conference	4th International Workshop on Intelligent Solutions in Embedded Systems (WISES 2006)
City	Vienna
Period	30/06/06 → …

Keywords

TEST-CASE GENERATION
MODEL CHECKING

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10.1109/WISES.2006.329116

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“This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder." “Copyright IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.”
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Kandl, S., Kirner, R., & Puschner, P. (2006). Development of a framework for automated systematic testing of safety-critical embedded systems. In W. Elmenreich, G. Novak, & RED. Seepold (Eds.), Proceedings of the Fourth International Workshop on Intelligent Solutions in Embedded Sysems (pp. 65-77). Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/WISES.2006.329116

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title = "Development of a framework for automated systematic testing of safety-critical embedded systems",

abstract = "In this paper we introduce the development of a framework for testing safety-critical embedded systems based on the concepts of model-based testing. In model-based testing the test cases are derived from a model of the system under test. In our approach the model is an automaton model that is automatically extracted from the C-source code of the system under test. Beside random test data generation the test case generation uses formal methods, in detail model checking techniques. To find appropriate test cases we use the requirements defined in the system specification. To cover further execution paths we developed an additional, to our best knowledge, novel method based on special structural coverage criteria. We present preliminary results on the model extraction using a concrete industrial case study from the automotive domain.",

keywords = "TEST-CASE GENERATION, MODEL CHECKING",

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publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

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Kandl, S, Kirner, R & Puschner, P 2006, Development of a framework for automated systematic testing of safety-critical embedded systems. in W Elmenreich, G Novak & RED Seepold (eds), Proceedings of the Fourth International Workshop on Intelligent Solutions in Embedded Sysems. Institute of Electrical and Electronics Engineers (IEEE), pp. 65-77, 4th International Workshop on Intelligent Solutions in Embedded Systems (WISES 2006), Vienna, 30/06/06. https://doi.org/10.1109/WISES.2006.329116

Development of a framework for automated systematic testing of safety-critical embedded systems. / Kandl, S.; Kirner, Raimund; Puschner, P.
Proceedings of the Fourth International Workshop on Intelligent Solutions in Embedded Sysems. ed. / W Elmenreich; G Novak; RED Seepold. Institute of Electrical and Electronics Engineers (IEEE), 2006. p. 65-77.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

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AU - Kandl, S.

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N1 - “This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder." “Copyright IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.”

PY - 2006

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N2 - In this paper we introduce the development of a framework for testing safety-critical embedded systems based on the concepts of model-based testing. In model-based testing the test cases are derived from a model of the system under test. In our approach the model is an automaton model that is automatically extracted from the C-source code of the system under test. Beside random test data generation the test case generation uses formal methods, in detail model checking techniques. To find appropriate test cases we use the requirements defined in the system specification. To cover further execution paths we developed an additional, to our best knowledge, novel method based on special structural coverage criteria. We present preliminary results on the model extraction using a concrete industrial case study from the automotive domain.

AB - In this paper we introduce the development of a framework for testing safety-critical embedded systems based on the concepts of model-based testing. In model-based testing the test cases are derived from a model of the system under test. In our approach the model is an automaton model that is automatically extracted from the C-source code of the system under test. Beside random test data generation the test case generation uses formal methods, in detail model checking techniques. To find appropriate test cases we use the requirements defined in the system specification. To cover further execution paths we developed an additional, to our best knowledge, novel method based on special structural coverage criteria. We present preliminary results on the model extraction using a concrete industrial case study from the automotive domain.

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KW - MODEL CHECKING

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DO - 10.1109/WISES.2006.329116

M3 - Conference contribution

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BT - Proceedings of the Fourth International Workshop on Intelligent Solutions in Embedded Sysems

A2 - Elmenreich, W

A2 - Novak, G

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PB - Institute of Electrical and Electronics Engineers (IEEE)

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Y2 - 30 June 2006

ER -

Kandl S, Kirner R, Puschner P. Development of a framework for automated systematic testing of safety-critical embedded systems. In Elmenreich W, Novak G, Seepold RED, editors, Proceedings of the Fourth International Workshop on Intelligent Solutions in Embedded Sysems. Institute of Electrical and Electronics Engineers (IEEE). 2006. p. 65-77 doi: 10.1109/WISES.2006.329116

Development of a framework for automated systematic testing of safety-critical embedded systems

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