Effects of Ti Buffer Layer on Retention and Electrical Characteristics of Cu-Based Conductive-Bridge Random Access Memory (CBRAM)

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@article{ae7946c2e4974d54af536e26c2d49f3e,

title = "Effects of Ti Buffer Layer on Retention and Electrical Characteristics of Cu-Based Conductive-Bridge Random Access Memory (CBRAM)",

author = "Nusrat Tamanna",

year = "2014",

doi = "DOI 10.1149/2.0031410ssl",

language = "English",

journal = "ECS Solid State Letters",

issn = "2162-8750",

publisher = "IOP Publishing Ltd.",

}