Fault Analysis in OSS Based on Program Slicing Metrics

S. Black; S. Counsell; T. Hall; D. Bowes

doi:10.1109/SEAA.2009.94

Fault Analysis in OSS Based on Program Slicing Metrics

S. Black, S. Counsell, T. Hall, D. Bowes

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

13 Citations (Scopus)

46 Downloads (Pure)

Abstract

In this paper, we investigate the barcode OSS using two of Weiser's original slice-based metrics (tightness and overlap) as a basis, complemented with fault data extracted from multiple versions of the same system. We compared the values of the metrics in functions with at least one reported fault with fault-free modules to determine a) whether significant differences in the two metrics would be observed and b) whether those metrics might allow prediction of faulty functions. Results revealed some interesting traits of the tightness metric and, in particular, how low values of that metric seemed to indicate fault-prone functions. A significant difference was found between the tightness metric values for faulty functions when compared to fault-free functions suggesting that tightness is the `better' of the two metrics in this sense. The overlap metric seemed less sensitive to differences between the two types of function.

Original language	English
Title of host publication	35th Euromicro Conf on Software Engineering and Advanced Applications
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Pages	3-10
DOIs	https://doi.org/10.1109/SEAA.2009.94
Publication status	Published - 2009

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10.1109/SEAA.2009.94

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Cite this

@inproceedings{e1c16daeecd94d019dba3648acb77438,

title = "Fault Analysis in OSS Based on Program Slicing Metrics",

abstract = "In this paper, we investigate the barcode OSS using two of Weiser's original slice-based metrics (tightness and overlap) as a basis, complemented with fault data extracted from multiple versions of the same system. We compared the values of the metrics in functions with at least one reported fault with fault-free modules to determine a) whether significant differences in the two metrics would be observed and b) whether those metrics might allow prediction of faulty functions. Results revealed some interesting traits of the tightness metric and, in particular, how low values of that metric seemed to indicate fault-prone functions. A significant difference was found between the tightness metric values for faulty functions when compared to fault-free functions suggesting that tightness is the `better' of the two metrics in this sense. The overlap metric seemed less sensitive to differences between the two types of function.",

author = "S. Black and S. Counsell and T. Hall and D. Bowes",

note = "“This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.{"} “Copyright IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.” DOI: 10.1109/SEAA.2009.94",

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AU - Counsell, S.

AU - Hall, T.

AU - Bowes, D.

N1 - “This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder." “Copyright IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.” DOI: 10.1109/SEAA.2009.94

PY - 2009

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N2 - In this paper, we investigate the barcode OSS using two of Weiser's original slice-based metrics (tightness and overlap) as a basis, complemented with fault data extracted from multiple versions of the same system. We compared the values of the metrics in functions with at least one reported fault with fault-free modules to determine a) whether significant differences in the two metrics would be observed and b) whether those metrics might allow prediction of faulty functions. Results revealed some interesting traits of the tightness metric and, in particular, how low values of that metric seemed to indicate fault-prone functions. A significant difference was found between the tightness metric values for faulty functions when compared to fault-free functions suggesting that tightness is the `better' of the two metrics in this sense. The overlap metric seemed less sensitive to differences between the two types of function.

AB - In this paper, we investigate the barcode OSS using two of Weiser's original slice-based metrics (tightness and overlap) as a basis, complemented with fault data extracted from multiple versions of the same system. We compared the values of the metrics in functions with at least one reported fault with fault-free modules to determine a) whether significant differences in the two metrics would be observed and b) whether those metrics might allow prediction of faulty functions. Results revealed some interesting traits of the tightness metric and, in particular, how low values of that metric seemed to indicate fault-prone functions. A significant difference was found between the tightness metric values for faulty functions when compared to fault-free functions suggesting that tightness is the `better' of the two metrics in this sense. The overlap metric seemed less sensitive to differences between the two types of function.

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