Fault isolation in nonlinear analog circuits with tolerance using the neural network-based L1-norm

Y. He, Y. Sun

Research output: Chapter in Book/Report/Conference proceedingConference contribution

12 Citations (Scopus)
98 Downloads (Pure)

Fingerprint

Dive into the research topics of 'Fault isolation in nonlinear analog circuits with tolerance using the neural network-based L1-norm'. Together they form a unique fingerprint.

Engineering & Materials Science