Highly Reliable Resistive Switching Without an Initial Forming Operation by Defect Engineering

Research output: Contribution to journal › Article › peer-review

20 Citations (Scopus)

Original language	English
Journal	IEEE Electron Device Letters
Volume	34
Issue number	12
DOIs	https://doi.org/10.1109/LED.2013.2284916
Publication status	Published - 2013

Access to Document

@article{0e92070391da4c42b143af74d623bf4d,

title = "Highly Reliable Resistive Switching Without an Initial Forming Operation by Defect Engineering",

author = "Nusrat Tamanna",

year = "2013",

doi = "10.1109/LED.2013.2284916",

language = "English",

volume = "34",

journal = "IEEE Electron Device Letters",

issn = "0741-3106",

publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

number = "12",

}