Latch susceptibility to transient faults and new hardening approach

Keyphrases

• Transient Fault 100%
• Internal Feedback 33%
• Internal Node 33%
• Positive Feedback 16%
• Hereafter 16%
• Small Area 16%
• Power Consumption 16%
• Area Consumption 16%
• Area Overhead 16%
• High Robustness 16%
• Low Susceptibility 16%
• Small Power 16%
• Soft Error 16%
• Back-to-back Converter 16%
• Lath Structure 16%
• Feedback Path 16%
• Hardened Latch 16%
• High Reliability Applications 16%
• Input Nodes 16%
• Power Delay Product 16%

Engineering

• Nodes 100%
• Internal Node 40%
• Output Node 40%
• Internal Feedback 40%
• Electric Power Utilization 20%
• Inverter 20%
• Area Overhead 20%
• Soft Error 20%
• Feedback Path 20%
• Input Node 20%

Computer Science

• Transient Fault 100%
• Power Consumption 16%
• Soft Error 16%
• High Reliability 16%