Low Cost Error Monitoring for Improved Maintainability of IoT Applications

Mauricio Gutierrez; Vasileios Tenentes; Daniele Rossi; Tom Kazmierski

Low Cost Error Monitoring for Improved Maintainability of IoT Applications

Mauricio Gutierrez, Vasileios Tenentes, Daniele Rossi, Tom Kazmierski

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Citation (Scopus)

Original language	English
Title of host publication	Proc. of 30th IEEE Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT’17)
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
ISBN (Electronic)	978-1-5386-0362-8
Publication status	Published - 2017

Cite this

@inproceedings{710d43e86eb64e28ae936efced2641a3,

title = "Low Cost Error Monitoring for Improved Maintainability of IoT Applications",

author = "Mauricio Gutierrez and Vasileios Tenentes and Daniele Rossi and Tom Kazmierski",

year = "2017",

language = "English",

booktitle = "Proc. of 30th IEEE Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT{\textquoteright}17)",

publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

address = "United States",

}

Low Cost Error Monitoring for Improved Maintainability of IoT Applications. / Gutierrez, Mauricio; Tenentes, Vasileios; Rossi, Daniele et al.
Proc. of 30th IEEE Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT’17). Institute of Electrical and Electronics Engineers (IEEE), 2017.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Low Cost Error Monitoring for Improved Maintainability of IoT Applications

AU - Gutierrez, Mauricio

AU - Tenentes, Vasileios

AU - Rossi, Daniele

AU - Kazmierski, Tom

PY - 2017

Y1 - 2017

M3 - Conference contribution

BT - Proc. of 30th IEEE Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT’17)

PB - Institute of Electrical and Electronics Engineers (IEEE)

ER -