Low Cost Error Monitoring for Improved Maintainability of IoT Applications

Mauricio Gutierrez, Vasileios Tenentes, Daniele Rossi, Tom Kazmierski

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    1 Citation (Scopus)
    Original languageEnglish
    Title of host publicationProc. of 30th IEEE Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT’17)
    PublisherInstitute of Electrical and Electronics Engineers (IEEE)
    ISBN (Electronic)978-1-5386-0362-8
    Publication statusPublished - 2017

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