Low cost nbti degradation detection and masking approaches

Martin Omaña, Daniele Rossi, Nicolò Bosio, Cecilia Metra

    Research output: Contribution to journalArticlepeer-review

    38 Citations (Scopus)


    Performance degradation of integrated circuits due to aging effects, such as Negative Bias Temperature Instability (NBTI), is becoming a great concern for current and future CMOS technology. In this paper, we propose two monitoring and masking approaches that detect late transitions due to NBTI degradation in the combinational part of critical data paths and guarantee the correctness of the provided output data by adapting the clock frequency. Compared to recently proposed alternative solutions, one of our approaches (denoted as Low Area and Power (LAP) approach) requires lower area overhead and lower, or comparable, power consumption, while exhibiting the same impact on system performance, while the other proposed approach (denoted as High Performance (HP) approach) allows us to reduce the impact on system performance, at the cost of some increase in area and power consumption.

    Original languageEnglish
    Article number6109246
    Pages (from-to)496-509
    Number of pages14
    JournalIEEE Transactions on Computers
    Issue number3
    Publication statusPublished - 20 Dec 2011


    • aging effect masking
    • aging sensor
    • NBTI performance degradation
    • transition monitoring


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