Abstract
Electronic devices with power-constrained embedded systems are used for a variety of IoT applications, such as geo-monitoring, parking sensors and surveillance, which may tolerate few errors and may not be constrained by a strict error detection latency requirement. In this poster, we propose a novel low power online error monitoring technique that produces an alarm signal when systematic erroneous behaviour has occurred over a pre-defined time interval. A monitoring architecture monitors the signal probabilities of the logic cones concurrently to its normal operation and compares them on-chip against the signature of error-free behaviour. Results on a set of the EPFL'15 benchmarks show an average error coverage of 82.9% of errors induced by stuck-At faults, with an average area cost of 1.2% and an error detection latency of [0.01, 3.3] milliseconds.
Original language | English |
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Title of host publication | Proceedings - 2017 22nd IEEE European Test Symposium, ETS 2017 |
Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
ISBN (Electronic) | 9781509054572 |
DOIs | |
Publication status | Published - 3 Jul 2017 |
Event | 22nd IEEE European Test Symposium, ETS 2017 - Limassol, Cyprus Duration: 22 May 2017 → 26 May 2017 |
Conference
Conference | 22nd IEEE European Test Symposium, ETS 2017 |
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Country/Territory | Cyprus |
City | Limassol |
Period | 22/05/17 → 26/05/17 |