Oscillation-based DFT for Second-order Bandpass OTA-C Filters

Masood ul Hasan, Yanqing Zhu, Yichuang Sun

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)
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Abstract

This paper describes a design for testability technique for second-order bandpass operational transconductance amplifier and capacitor filters using an oscillation-based test topology. The oscillation-based test structure is a vectorless output test strategy easily extendable to built-in self-test. The proposed methodology converts filter under test into a quadrature oscillator using very simple techniques and measures the output frequency. Using feedback loops with nonlinear block, the filter-to-oscillator conversion techniques easily convert the bandpass OTA-C filter into an oscillator. With a minimum number of extra components, the proposed scheme requires a negligible area overhead. The validity of the proposed method has been verified using comparison between faulty and fault-free simulation results of Tow-Thomas and KHN OTA-C filters. Simulation results in 0.25μm CMOS technology show that the proposed oscillation-based test strategy for OTA-C filters is suitable for catastrophic and parametric faults testing and also effective in detecting single and multiple faults with high fault coverage.
Original languageEnglish
Pages (from-to)1807–1824
Number of pages18
JournalCircuits, Systems, and Signal Processing
Volume37
Issue number5
Early online date6 Sept 2017
DOIs
Publication statusE-pub ahead of print - 6 Sept 2017

Keywords

  • Analog circuit testing · Built-in self-test · Oscillation-based test (OBT) · OTA-C filter

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