Oscillation-based DFT for second-order OTA-C filters

M. Hasan; Y. Sun; X. Zhu; J. Moritz

doi:10.1109/ISCAS.2008.4541519

Oscillation-based DFT for second-order OTA-C filters

M. Hasan, Y. Sun, X. Zhu, J. Moritz

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

11 Citations (Scopus)

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Abstract

We propose an easily implemented and low-cost design-for-testability scheme for OTA-C filters based on an oscillation-based test (OBT) methodology. The OBT method is a vectorless output test strategy easily applicable to built-in self-test. During test mode, the filter under test is converted into an oscillator by establishing the oscillation condition in its transfer function. The oscillator frequency can be measured using digital circuitry and deviations from the cut-off frequency indicate faulty behaviour of the filter. The proposed method is suitable for both catastrophic and parametric fault diagnosis and is effective in detecting single and multiple faults. The validity of the proposed method has been verified using comparison between faulty and fault-free simulation results of two-integrator loop, Tow-Thomas and KHN OTA-C filters. Simulation results for 2nd order filters using a 0.25 mum CMOS technology show that the proposed oscillation-based test strategy has more than 96% fault coverage and, with a minimum number of extra components, requires a negligible area overhead.

Original language	English
Title of host publication	Procs IEEE Int Symposium on Circuits & Systems
Subtitle of host publication	ISCAS 2008
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Pages	720-723
ISBN (Print)	978-1-4244-1684-4
DOIs	https://doi.org/10.1109/ISCAS.2008.4541519
Publication status	Published - 2008

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10.1109/ISCAS.2008.4541519

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@inproceedings{0207130db0854c8ea601a4d25f06fcc2,

title = "Oscillation-based DFT for second-order OTA-C filters",

abstract = "We propose an easily implemented and low-cost design-for-testability scheme for OTA-C filters based on an oscillation-based test (OBT) methodology. The OBT method is a vectorless output test strategy easily applicable to built-in self-test. During test mode, the filter under test is converted into an oscillator by establishing the oscillation condition in its transfer function. The oscillator frequency can be measured using digital circuitry and deviations from the cut-off frequency indicate faulty behaviour of the filter. The proposed method is suitable for both catastrophic and parametric fault diagnosis and is effective in detecting single and multiple faults. The validity of the proposed method has been verified using comparison between faulty and fault-free simulation results of two-integrator loop, Tow-Thomas and KHN OTA-C filters. Simulation results for 2nd order filters using a 0.25 mum CMOS technology show that the proposed oscillation-based test strategy has more than 96% fault coverage and, with a minimum number of extra components, requires a negligible area overhead.",

author = "M. Hasan and Y. Sun and X. Zhu and J. Moritz",

note = "“This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.{"} “Copyright IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.”",

year = "2008",

doi = "10.1109/ISCAS.2008.4541519",

language = "English",

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T1 - Oscillation-based DFT for second-order OTA-C filters

AU - Hasan, M.

AU - Sun, Y.

AU - Zhu, X.

AU - Moritz, J.

N1 - “This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder." “Copyright IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.”

PY - 2008

Y1 - 2008

N2 - We propose an easily implemented and low-cost design-for-testability scheme for OTA-C filters based on an oscillation-based test (OBT) methodology. The OBT method is a vectorless output test strategy easily applicable to built-in self-test. During test mode, the filter under test is converted into an oscillator by establishing the oscillation condition in its transfer function. The oscillator frequency can be measured using digital circuitry and deviations from the cut-off frequency indicate faulty behaviour of the filter. The proposed method is suitable for both catastrophic and parametric fault diagnosis and is effective in detecting single and multiple faults. The validity of the proposed method has been verified using comparison between faulty and fault-free simulation results of two-integrator loop, Tow-Thomas and KHN OTA-C filters. Simulation results for 2nd order filters using a 0.25 mum CMOS technology show that the proposed oscillation-based test strategy has more than 96% fault coverage and, with a minimum number of extra components, requires a negligible area overhead.

AB - We propose an easily implemented and low-cost design-for-testability scheme for OTA-C filters based on an oscillation-based test (OBT) methodology. The OBT method is a vectorless output test strategy easily applicable to built-in self-test. During test mode, the filter under test is converted into an oscillator by establishing the oscillation condition in its transfer function. The oscillator frequency can be measured using digital circuitry and deviations from the cut-off frequency indicate faulty behaviour of the filter. The proposed method is suitable for both catastrophic and parametric fault diagnosis and is effective in detecting single and multiple faults. The validity of the proposed method has been verified using comparison between faulty and fault-free simulation results of two-integrator loop, Tow-Thomas and KHN OTA-C filters. Simulation results for 2nd order filters using a 0.25 mum CMOS technology show that the proposed oscillation-based test strategy has more than 96% fault coverage and, with a minimum number of extra components, requires a negligible area overhead.

U2 - 10.1109/ISCAS.2008.4541519

DO - 10.1109/ISCAS.2008.4541519

M3 - Conference contribution

SN - 978-1-4244-1684-4

SP - 720

EP - 723

BT - Procs IEEE Int Symposium on Circuits & Systems

PB - Institute of Electrical and Electronics Engineers (IEEE)

ER -

Oscillation-based DFT for second-order OTA-C filters

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