This paper describes a design for testability technique for operational transconductance amplifier and capacitor filters using an oscillation-based test topology. The oscillation-based test structure is a vectorless output test strategy easily extendable to built-in self-test. The proposed methodology converts filter under test into a quadrature oscillator using very simple techniques and measures the output frequency. The oscillation frequency may be considered as a digital signal and it can be evaluated using digital circuitry therefore the test time is very small. These characteristics imply that the proposed method is very suitable for catastrophic and parametric faults testing and also effective in detecting single and multiple faults. The validity of the proposed method has been verified using comparison between faulty and fault-free simulation results of two integrator loop and Tow-Thomas filters. Simulation results in 0.25 mum CMOS technology show that the proposed oscillation-based test strategy for OTA-C filters has 87% fault coverage and with a minimum number of extra components, requires a negligible area overhead.
|Title of host publication
|Procs of the 13th IEEE Int Conf on Electronics, Circuits and Systems (UCECS '06)
|Institute of Electrical and Electronics Engineers (IEEE)
|Published - 2006