| Original language | English |
|---|---|
| Pages (from-to) | 1-10 |
| Journal | Plagiary |
| Volume | 1 |
| Issue number | 5 |
| Publication status | Published - Jan 2006 |
Keywords
- Computer Science
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Plagiarism is easy, but also easy to detect
- C. Lyon
- , R. Barrett
- , J. Malcolm
Research output: Contribution to journal › Article › peer-review
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