Preparation and characterization of 33S samples for 33S(n,α)30Si cross-section measurements at the n_TOF facility at CERN

J. Praena, F. J. Ferrer, W. Vollenberg, M. Sabaté-Gilarte, B. Fernández, J. García-López, I. Porras, J. M. Quesada, S. Altstadt, J. Andrzejewski, L. Audouin, V. Bécares, M. Barbagallo, F. Bečvář, F. Belloni, E. Berthoumieux, J. Billowes, V. Boccone, D. Bosnar, M. BruggerF. Calviño, M. Calviani, D. Cano-Ott, C. Carrapiço, F. Cerutti, E. Chiaveri, M. Chin, N. Colonna, G. Cortés, M. A. Cortés-Giraldo, M. Diakaki, M. Dietz, C. Domingo-Pardo, R. Dressler, I. Durán, C. Eleftheriadis, A. Ferrari, K. Fraval, V. Furman, K. Göbel, M. B. Gómez-Hornillos, S. Ganesan, A. R. García, G. Giubrone, I. F. Gonçalves, E. González-Romero, A. Goverdovski, E. Griesmayer, C. Guerrero, T. Rauscher, The n_TOF Collaboration

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)
28 Downloads (Pure)


Thin 33S samples for the study of the 33S(n,α)30Si cross-section at the n_TOF facility at CERN were made by thermal evaporation of 33S powder onto a dedicated substrate made of kapton covered with thin layers of copper, chromium and titanium. This method has provided for the first time bare sulfur samples a few centimeters in diameter. The samples have shown an excellent adherence with no mass loss after few years and no sublimation in vacuum at room temperature. The determination of the mass thickness of 33S has been performed by means of Rutherford backscattering spectrometry. The samples have been successfully tested under neutron irradiation.

Original languageEnglish
Pages (from-to)142-147
Number of pages6
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Early online date15 Feb 2018
Publication statusPublished - 11 May 2018


  • Neutron induced alpha emission
  • Rutherford backscattering
  • Thermal evaporation


Dive into the research topics of 'Preparation and characterization of 33S samples for 33S(n,α)30Si cross-section measurements at the n_TOF facility at CERN'. Together they form a unique fingerprint.

Cite this