Simulation of Near-Tip Crack Behaviour and Its Correlation to Fatigue Crack Growth with a Modified Strip-Yield Model

L. Wang, Y.K. Chen, W. Tiu, Y. Xu

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    3 Citations (Scopus)
    116 Downloads (Pure)

    Abstract

    A modified strip-yield model has been developed to simulate the plasticity-induced crack closure under the constant amplitude (CA) and a single overload loading conditions. The paper focuses on the simulation of the near tip crack profiles and stress distributions during the fatigue process. Detailed information on near-tip stress and displacement fields at the maximum load (Pmax), the minimum load (Pmin), and the crack opening load (Pop) of a fatigue load cycle have been presented. The correlation of the crack closure to the near-tip material fatigue damage has been investigated and used to rationalize the crack growth behaviour under the CA and a single overload loading conditions.
    Original languageEnglish
    Pages (from-to)77-91
    Number of pages15
    JournalInternational Journal of Modelling, Identification and Control
    Volume5
    Issue number1
    DOIs
    Publication statusPublished - 2008

    Keywords

    • Fatigue
    • Plasticity-Induced Crack Closure
    • Numerical Modelling

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