Simulation of Near-Tip Crack Behaviour and Its Correlation to Fatigue Crack Growth with a Modified Strip-Yield Model

L. Wang, Y.K. Chen, W. Tiu, Y. Xu

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)
120 Downloads (Pure)

Abstract

A modified strip-yield model has been developed to simulate the plasticity-induced crack closure under the constant amplitude (CA) and a single overload loading conditions. The paper focuses on the simulation of the near tip crack profiles and stress distributions during the fatigue process. Detailed information on near-tip stress and displacement fields at the maximum load (Pmax), the minimum load (Pmin), and the crack opening load (Pop) of a fatigue load cycle have been presented. The correlation of the crack closure to the near-tip material fatigue damage has been investigated and used to rationalize the crack growth behaviour under the CA and a single overload loading conditions.
Original languageEnglish
Pages (from-to)77-91
Number of pages15
JournalInternational Journal of Modelling, Identification and Control
Volume5
Issue number1
DOIs
Publication statusPublished - 2008

Keywords

  • Fatigue
  • Plasticity-Induced Crack Closure
  • Numerical Modelling

Fingerprint

Dive into the research topics of 'Simulation of Near-Tip Crack Behaviour and Its Correlation to Fatigue Crack Growth with a Modified Strip-Yield Model'. Together they form a unique fingerprint.

Cite this