Software defect prediction: do different classifiers find the same defects?

David Bowes, Tracy Hall, Jean petric

Research output: Contribution to journalArticlepeer-review

53 Citations (Scopus)
42 Downloads (Pure)

Fingerprint

Dive into the research topics of 'Software defect prediction: do different classifiers find the same defects?'. Together they form a unique fingerprint.

Engineering & Materials Science