Abstract
This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of those areas. A complete range of circuit components are covered and test issues from the SoC perspective. An essential reference for researchers and engineers in mixed signal testing, postgraduate and senior undergraduate students.
| Original language | English |
|---|---|
| Publisher | Institution of Engineering and Technology (IET) |
| Number of pages | 390 |
| ISBN (Electronic) | 9780863419997 |
| ISBN (Print) | 9780863417450 |
| DOIs | |
| Publication status | Published - 1 Jan 2008 |
Keywords
- Analogue integrated circuits
- Automatic SoC testing
- Automatic testing
- Fault diagnosis
- Integrated circuit testing
- Mixed analogue-digital integrated circuits
- Mixed-signal integrated circuits
- RF integrated circuits
- Single-chip transceiver
- System-on-chip
- Systems-on-chip