Test and diagnosis of analogue, mixed-signal and RF integrated circuits: The system on chip approach

    Research output: Book/ReportBook

    17 Citations (Scopus)

    Abstract

    This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of those areas. A complete range of circuit components are covered and test issues from the SoC perspective. An essential reference for researchers and engineers in mixed signal testing, postgraduate and senior undergraduate students.

    Original languageEnglish
    PublisherInstitution of Engineering and Technology (IET)
    Number of pages390
    ISBN (Electronic)9780863419997
    ISBN (Print)9780863417450
    DOIs
    Publication statusPublished - 1 Jan 2008

    Keywords

    • Analogue integrated circuits
    • Automatic SoC testing
    • Automatic testing
    • Fault diagnosis
    • Integrated circuit testing
    • Mixed analogue-digital integrated circuits
    • Mixed-signal integrated circuits
    • RF integrated circuits
    • Single-chip transceiver
    • System-on-chip
    • Systems-on-chip

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