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Time-efficient fault detection and diagnosis system for analog circuits
Qiwu Luo, Yigang He,
Yichuang Sun
Communications and Intelligent Systems
Centre for Engineering Research
School of Physics, Engineering & Computer Science
Department of Engineering and Technology
Centre for Future Societies Research
Networks and Security Research Centre
Research output
:
Contribution to journal
›
Article
›
peer-review
8
Citations (Scopus)
47
Downloads (Pure)
Overview
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Keyphrases
Analog Circuits
100%
Analog Faults
50%
Array-based
50%
Circuit Size
50%
Competitive Performance
50%
Component Tolerance
50%
Computation Time
50%
Delayed Diagnosis
50%
Diagnostic Accuracy
50%
Diagnostic Algorithm
50%
Electronic Equipment
50%
Embedding Algorithm
50%
Ethernet Interface
50%
Fault Analysis
50%
Fault Detection System
100%
Fault Diagnosis
50%
Fault Diagnosis System
100%
Fault Diagnostic System
50%
Field Programmable Gate Arrays
100%
Good Compatibility
50%
Hardware Structure
50%
Information Fusion
50%
Integrated Components
50%
Multiple Faults
50%
Network Analysis
50%
Online Monitoring
50%
Processing Speed
50%
Proposed Methodology
50%
Remote Controlling
50%
Remote Monitoring
50%
Smart Circuit
50%
Time Effectiveness
50%
Two-dimensional Information
50%
Two-port Network
50%
Ultralarge-scale Integration
50%
Engineering
Analog Circuit
100%
Component Tolerance
50%
Computational Time
50%
Diagnostic Algorithm
50%
Electric Network Analysis
50%
Ethernet Interface
50%
Experimental Result
50%
Fault Detection and Diagnosis
100%
Field Programmable Gate Arrays
100%
Health Monitoring
50%
Port Network
50%
System Diagnostics
50%
Test Point
50%
Two Dimensional
50%
ULSI Circuits
50%
Computer Science
Analog Circuit
100%
Computational Time
50%
Diagnostic System
50%
Ethernet Interface
50%
Experimental Result
50%
Fault detection
100%
Fault Diagnosis
100%
Field Programmable Gate Arrays
100%
Hardware Structure
50%
Processing Speed
50%
Remote Monitoring
50%
Scale Integration
50%