Wavelet neural network approach for fault diagnosis of analogue circuits

Y. Sun, Y. He, Y. Tan

    Research output: Contribution to journalArticlepeer-review

    96 Citations (Scopus)

    Abstract

    A systematic method for fault diagnosis of analogue circuits based on the combination of neural networks and wavelet transforms is presented. Using wavelet decomposition as a tool for removing noise from the sampled signals, optimal feature information is extracted by wavelet noise removal, multi-resolution decomposition, PCA (principal component analysis) and data normalisation. The features are applied to the proposed wavelet neural network and the fault patterns are classified. Diagnosis principles and procedures are described. The reliability of the method and comparison with other methods are shown by two active filter examples.
    Original languageEnglish
    Pages (from-to)379-384
    JournalIEE Proceedings Circuits Devices and Systems
    Volume151
    Issue number4
    Publication statusPublished - 2004

    Fingerprint

    Dive into the research topics of 'Wavelet neural network approach for fault diagnosis of analogue circuits'. Together they form a unique fingerprint.

    Cite this