Welcome Message from the General Chairs and Technical Program Chairs

Damien Coyle; Salvatore Livatino; Pasquale Arpaia; Lucio Tommaso De Paolis; Loredana Cristaldi; Antonio Esposito; Egidio De Benedetto; Michael Kuhl; Karl McCreadie; Flaviana Tagliaferri; Chiara Tagliaferri; Sabatina Criscuolo

doi:10.1109/MetroXRAINE62247.2024.10796973

Welcome Message from the General Chairs and Technical Program Chairs

Damien Coyle, Salvatore Livatino, Pasquale Arpaia, Lucio Tommaso De Paolis, Loredana Cristaldi, Antonio Esposito, Egidio De Benedetto, Michael Kuhl, Karl McCreadie, Flaviana Tagliaferri, Chiara Tagliaferri, Sabatina Criscuolo

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

On behalf of the Organizing Committee, we wish to welcome you to the 2024 IEEE International Conference onMetrology for eXtended Reality, Artificial Intelligence, and Neural Engineering (IEEE MetroXRAINE 2024). MetroXRAINE 2024 promotes synergies among experts in emerging technologies highly influencing frontierapplications: eXtended Reality, Brain-Computer Interface, and Artificial Intelligence, with special attention to themeasurement and its quality on the field (applied metrology).

Original language	English
Title of host publication	2024 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE)
Place of Publication	St Albans, UK
Pages	1-2
Number of pages	2
ISBN (Electronic)	979-8-3503-7800-9
DOIs	https://doi.org/10.1109/MetroXRAINE62247.2024.10796973
Publication status	Published - 24 Dec 2024
Event	2024 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering - IEEE MetroXRAINE - The Alban Arena, St Albans, United Kingdom Duration: 21 Oct 2024 → 23 Oct 2024 https://metroxraine.org/index

Conference

Conference	2024 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering - IEEE MetroXRAINE
Abbreviated title	EEE MetroXRAINE 2024
Country/Territory	United Kingdom
City	St Albans
Period	21/10/24 → 23/10/24
Internet address	https://metroxraine.org/index

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10.1109/MetroXRAINE62247.2024.10796973Licence: Unspecified

Cite this

Coyle, D., Livatino, S., Arpaia, P., De Paolis, L. T., Cristaldi, L., Esposito, A., De Benedetto, E., Kuhl, M., McCreadie, K., Tagliaferri, F., Tagliaferri, C., & Criscuolo, S. (2024). Welcome Message from the General Chairs and Technical Program Chairs. In 2024 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE) (pp. 1-2). https://doi.org/10.1109/MetroXRAINE62247.2024.10796973

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title = "Welcome Message from the General Chairs and Technical Program Chairs",

abstract = "On behalf of the Organizing Committee, we wish to welcome you to the 2024 IEEE International Conference onMetrology for eXtended Reality, Artificial Intelligence, and Neural Engineering (IEEE MetroXRAINE 2024). MetroXRAINE 2024 promotes synergies among experts in emerging technologies highly influencing frontierapplications: eXtended Reality, Brain-Computer Interface, and Artificial Intelligence, with special attention to themeasurement and its quality on the field (applied metrology).",

author = "Damien Coyle and Salvatore Livatino and Pasquale Arpaia and {De Paolis}, {Lucio Tommaso} and Loredana Cristaldi and Antonio Esposito and {De Benedetto}, Egidio and Michael Kuhl and Karl McCreadie and Flaviana Tagliaferri and Chiara Tagliaferri and Sabatina Criscuolo",

note = "{\textcopyright} 2024 IEEE.; 2024 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering - IEEE MetroXRAINE, EEE MetroXRAINE 2024 ; Conference date: 21-10-2024 Through 23-10-2024",

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doi = "10.1109/MetroXRAINE62247.2024.10796973",

language = "English",

isbn = "979-8-3503-7799-6",

pages = "1--2",

booktitle = "2024 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE)",

url = "https://metroxraine.org/index",

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Coyle, D, Livatino, S, Arpaia, P, De Paolis, LT, Cristaldi, L, Esposito, A, De Benedetto, E, Kuhl, M, McCreadie, K, Tagliaferri, F, Tagliaferri, C & Criscuolo, S 2024, Welcome Message from the General Chairs and Technical Program Chairs. in 2024 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE). St Albans, UK, pp. 1-2, 2024 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering - IEEE MetroXRAINE, St Albans, United Kingdom, 21/10/24. https://doi.org/10.1109/MetroXRAINE62247.2024.10796973

Welcome Message from the General Chairs and Technical Program Chairs. / Coyle, Damien; Livatino, Salvatore; Arpaia, Pasquale et al.
2024 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE). St Albans, UK, 2024. p. 1-2.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Welcome Message from the General Chairs and Technical Program Chairs

AU - Coyle, Damien

AU - Livatino, Salvatore

AU - Arpaia, Pasquale

AU - De Paolis, Lucio Tommaso

AU - Cristaldi, Loredana

AU - Esposito, Antonio

AU - De Benedetto, Egidio

AU - Kuhl, Michael

AU - McCreadie, Karl

AU - Tagliaferri, Flaviana

AU - Tagliaferri, Chiara

AU - Criscuolo, Sabatina

PY - 2024/12/24

Y1 - 2024/12/24

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AB - On behalf of the Organizing Committee, we wish to welcome you to the 2024 IEEE International Conference onMetrology for eXtended Reality, Artificial Intelligence, and Neural Engineering (IEEE MetroXRAINE 2024). MetroXRAINE 2024 promotes synergies among experts in emerging technologies highly influencing frontierapplications: eXtended Reality, Brain-Computer Interface, and Artificial Intelligence, with special attention to themeasurement and its quality on the field (applied metrology).

U2 - 10.1109/MetroXRAINE62247.2024.10796973

DO - 10.1109/MetroXRAINE62247.2024.10796973

M3 - Conference contribution

SN - 979-8-3503-7799-6

SP - 1

EP - 2

BT - 2024 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE)

CY - St Albans, UK

T2 - 2024 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering - IEEE MetroXRAINE

Y2 - 21 October 2024 through 23 October 2024

ER -

Welcome Message from the General Chairs and Technical Program Chairs

Abstract

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