University of Hertfordshire

By the same authors

Automated Visual Defect Detection for Flat Steel Surface: A Survey

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Standard

Automated Visual Defect Detection for Flat Steel Surface: A Survey. / Luo, Qiwu ; Fang, Xiaoxin; Liu, Li; Yang, Chunhua; Sun, Yichuang.

IEEE International Instrumentation & Measurement Technology Conference (I2MTC). IEEE, 2021.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Harvard

Luo, Q, Fang, X, Liu, L, Yang, C & Sun, Y 2021, Automated Visual Defect Detection for Flat Steel Surface: A Survey. in IEEE International Instrumentation & Measurement Technology Conference (I2MTC). IEEE, IEEE I2MTC 2021 - The International Instrumentation and Measurement Technology Conference, Ottawa, Canada, 17/05/21.

APA

Luo, Q., Fang, X., Liu, L., Yang, C., & Sun, Y. (2021). Automated Visual Defect Detection for Flat Steel Surface: A Survey. In IEEE International Instrumentation & Measurement Technology Conference (I2MTC) IEEE.

Vancouver

Luo Q, Fang X, Liu L, Yang C, Sun Y. Automated Visual Defect Detection for Flat Steel Surface: A Survey. In IEEE International Instrumentation & Measurement Technology Conference (I2MTC). IEEE. 2021

Author

Luo, Qiwu ; Fang, Xiaoxin ; Liu, Li ; Yang, Chunhua ; Sun, Yichuang. / Automated Visual Defect Detection for Flat Steel Surface: A Survey. IEEE International Instrumentation & Measurement Technology Conference (I2MTC). IEEE, 2021.

Bibtex

@inproceedings{e0960716abdf413f9f24e5aef9f0a1a9,
title = "Automated Visual Defect Detection for Flat Steel Surface: A Survey",
author = "Qiwu Luo and Xiaoxin Fang and Li Liu and Chunhua Yang and Yichuang Sun",
year = "2021",
month = may,
day = "18",
language = "English",
booktitle = "IEEE International Instrumentation & Measurement Technology Conference (I2MTC)",
publisher = "IEEE",
note = "IEEE I2MTC 2021 - The International Instrumentation and Measurement Technology Conference ; Conference date: 17-05-2021 Through 20-05-2021",
url = "https://i2mtc2021.ieee-ims.org/",

}

RIS

TY - GEN

T1 - Automated Visual Defect Detection for Flat Steel Surface: A Survey

AU - Luo, Qiwu

AU - Fang, Xiaoxin

AU - Liu, Li

AU - Yang, Chunhua

AU - Sun, Yichuang

PY - 2021/5/18

Y1 - 2021/5/18

M3 - Conference contribution

BT - IEEE International Instrumentation & Measurement Technology Conference (I2MTC)

PB - IEEE

T2 - IEEE I2MTC 2021 - The International Instrumentation and Measurement Technology Conference

Y2 - 17 May 2021 through 20 May 2021

ER -