University of Hertfordshire

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Oscillation-based DFT for Second-order Bandpass OTA-C Filters

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Original languageEnglish
Pages (from-to)1807–1824
Number of pages18
JournalCircuits, Systems, and Signal Processing
Early online date6 Sep 2017
Publication statusE-pub ahead of print - 6 Sep 2017


This paper describes a design for testability technique for second-order bandpass operational transconductance amplifier and capacitor filters using an oscillation-based test topology. The oscillation-based test structure is a vectorless output test strategy easily extendable to built-in self-test. The proposed methodology converts filter under test into a quadrature oscillator using very simple techniques and measures the output frequency. Using feedback loops with nonlinear block, the filter-to-oscillator conversion techniques easily convert the bandpass OTA-C filter into an oscillator. With a minimum number of extra components, the proposed scheme requires a negligible area overhead. The validity of the proposed method has been verified using comparison between faulty and fault-free simulation results of Tow-Thomas and KHN OTA-C filters. Simulation results in 0.25μm CMOS technology show that the proposed oscillation-based test strategy for OTA-C filters is suitable for catastrophic and parametric faults testing and also effective in detecting single and multiple faults with high fault coverage.


This document is the Accepted Manuscript version. Under embargo until 6 September 2018. The final publication is available at Springer via

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